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TCMInline & offline spectral measurement Reflectance/transmittance;chromaticity;OD and layer thickness
● Are versatile and can be used for a wide variety of applications!
● Offer you the speed, stability and accuracy needed for reliable inline process monitoring!
● Help you to boost your production efficiency!
● Save raw materials!
● Are industry-proven and widely used by trend-setting companies!
● Come with excellent support!
● Color filter
● Polarization film
● Plasma display
● ITO film
● Plastics
● Paint
● Various films
● Glass
● Mirrors
● AR coatings
● Filters
… and many more!
Octis is a spectral reflectance measurement system for high precision thin film control. It allows for thickness measurement, defect evaluation, analysis of surface roughness and surface profiles in various applications. The offline SCAN system can make either single point measurements or a continuous motorized scanned measurement in longitudinal direction. Contactless measurement, and proprietary data analysis soft ware makes it ideal for process development and optimization. For each product or sample type, all the sample related measurement parameters can be defined, saved and loaded within configuration sets.
● Foils in packaging
● Printed electronics & PCBs
● TSV/TGV
● Tablet coating
● Curved display
● Battery pack welding
● "All in One" design with scanning table 1-axis motorized longitudinal table (150 mm travel range) Rotation axis with wire clamping device (360° rotation)
● Laser diffraction measurement channel (Wire Diameter measurement)
● NIR spectrometer (850-1700 nm, 512-pixel line) High resolution NIR spectrometer(1340-1660 nm, 256-pixel line)*additional
● Suitable for round and rectangular wires
● Integrated PC